This inventor holds 1 USPTO granted patent. Top assignee: Ekahau, Inc.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Jarno Kinnunen: Innovator in Radio Frequency Mapping
Introduction
Jarno Kinnunen is a notable inventor based in Porvoo, Finland. He has made significant contributions to the field of radio frequency (RF) technology. His innovative work focuses on generating multi-dimensional models of physical environments for mapping RF measurements.
Latest Patents
Kinnunen holds a patent for a device that can detect RF signals in a physical environment using one or more antennas. This device generates RF measurements based on the detected signals. Additionally, it creates a multi-dimensional model of the environment using sensor information. The model can be represented as a 2D or 3D floor plan. The device maps RF measurements to specific locations within this model. It also features a graphical user interface that can display the model and the mapping, potentially as a heat map for network analysis. Kinnunen's patent is a testament to his innovative approach in this technological domain, with a total of 1 patent.
Career Highlights
Jarno Kinnunen is associated with Ekahau, Inc., a company known for its expertise in wireless network design and optimization. His work at Ekahau has allowed him to apply his inventive skills in practical applications, enhancing the understanding and management of RF environments.
Collaborations
Kinnunen collaborates with talented individuals such as Mikko Lauronen and Miika Siren. Their combined efforts contribute to the advancement of technology in the field of RF mapping and analysis.
Conclusion
Jarno Kinnunen's innovative contributions to radio frequency technology exemplify the impact of inventive minds in shaping modern solutions. His work continues to influence the way we understand and interact with physical environments through RF measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile