Oak Ridge, NC, United States of America

Jared J Lance

This inventor holds 1 USPTO granted patent. Top assignee: Lockheed Martin Corporation. Active years: 2012.


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Jared J Lance: Innovator in Image Registration Technology

Introduction

Jared J Lance is a notable inventor based in Oak Ridge, NC (US). He has made significant contributions to the field of image registration technology. His innovative approach has led to the development of a unique patent that enhances the accuracy and efficiency of image processing.

Latest Patents

Jared J Lance holds a patent for "Iterative region-based automated control point generation." This invention presents a technique for registering two images. The method involves generating a base transform between the first and second images, creating a plurality of candidate control points, and forming meshed regions from these points. This process allows for precise mapping of the first image to the second image. The patent also includes a program storage medium encoded with instructions for executing the method, a computing apparatus programmed to perform the method, and a data product produced by the method.

Career Highlights

Jared J Lance is currently employed at Lockheed Martin Corporation, where he applies his expertise in image processing and technology development. His work has contributed to advancements in various projects within the company. He is recognized for his innovative thinking and problem-solving skills in the field.

Collaborations

Some of Jared's coworkers include Steven S Perkins and Mark E Wear. Their collaboration has fostered a productive environment that encourages innovation and the sharing of ideas.

Conclusion

Jared J Lance is a distinguished inventor whose work in image registration technology has made a significant impact. His patent demonstrates his commitment to advancing technology and improving processes in the field.

Profile summary based on public USPTO records.
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