Wilsonville, OR, United States of America

Jared Greco



 

Average Co-Inventor Count = 7.7

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2020-2024

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4 patents (USPTO):Explore Patents

Title: The Innovative Journey of Jared Greco

Introduction

Jared Greco is a notable inventor based in Wilsonville, OR (US). He has made significant contributions to the field of metrology, with a focus on high-speed, non-contact coordinate measurements. With a total of 4 patents to his name, Greco's work exemplifies innovation and technical expertise.

Latest Patents

One of Jared Greco's latest patents is a metrology system designed for high-speed, non-contact coordinate measurements of parts. This system includes a metrology bridge that can be coupled to a measurement assembly. The measurement assembly features a stage that is moveable across multiple independent axes. The bridge comprises a housing, mounting members coupled to the housing, and a plurality of sensors mounted within the housing. The mounting members allow for the rotatable coupling of the housing to the measurement assembly. Additionally, the sensor elements of the plurality of sensor devices are aligned along the length of the housing and directed out of the housing.

Career Highlights

Throughout his career, Jared Greco has worked with several companies, including Dwfritz Automation, Inc. and Industrial Metrology Solutions LLC. His experience in these organizations has contributed to his expertise in metrology and innovation.

Collaborations

Jared has collaborated with notable individuals in his field, including Robert Batten and Mark William Baker. These collaborations have further enriched his work and contributed to the development of advanced metrology systems.

Conclusion

Jared Greco's contributions to the field of metrology through his innovative patents and collaborations highlight his role as a significant inventor. His work continues to influence the industry and pave the way for future advancements in measurement technology.

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