Livonia, MI, United States of America

Jared Clark

This inventor holds 1 USPTO granted patent. Top assignee: Ford Global Technolgoies, LLC. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jared Clark. Retrieved from https://idiyas.com/inventor/jared-clark

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Jared Clark and Parametric Design for Vehicle Instrument Panels.

Introduction

Jared Clark is an inventor associated with Livonia, Michigan, and Ford Global Technologies, LLC. His patent work concerns a method for designing an instrument panel support structure for a vehicle.

Latest Patents

Clark is credited with 1 patent: “Method of Parametric Design of an Instrument Panel Support Structure.” The method uses a three-dimensional coordinate as an input parameter to define the support structure relative to the vehicle. A design is generated from that parameter and evaluated against predetermined criteria. If the design does not meet those criteria, the input parameter is modified.

Career Highlights

The available information connects Clark’s invention to Ford Global Technologies, LLC, which develops and manages intellectual property associated with Ford innovations. His patent describes a parameter-driven approach to designing vehicle instrument panel supports.

Collaborations

Michael Joseph Walraven and Daniel Cornelius Bach are identified as Clark’s coworkers. The provided information does not specify their roles in the patent or the invention.

Conclusion

Jared Clark’s patent documents a structured, adjustable method for designing vehicle instrument panel support structures, reflecting an engineering focus on evaluating and refining designs against defined criteria.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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