Location History:
- Liège, BE (2010 - 2014)
- Liege, BE (2013 - 2014)
- Leuven, BE (2014)
- Brussels, BE (2018)
Company Filing History:
5 out of 557 
5 out of 346 
2 out of 967 
Years Active: 2010-2025
Title: Janusz Bogdanowicz: Innovator in Microstructure Measurement and Semiconductor Technology
Introduction
Janusz Bogdanowicz is a prominent inventor based in Brussels, Belgium. He has made significant contributions to the fields of microstructure measurement and semiconductor technology. With a total of 7 patents to his name, his work has had a considerable impact on the industry.
Latest Patents
Among his latest patents is a method and apparatus for measuring a lateral depth in a microstructure. This innovative approach provides a spectroscopic measurement for determining a lateral recess depth in the sidewall of a microstructure. The method involves generating an incident energy beam that produces a spectroscopic response, which is then analyzed to derive a parameter representative of the lateral recess depth. Another notable patent is related to the differential heating of elongate nano-scaled structures. This method fabricates semiconductor devices by producing non-parallel nano-scaled structures on a substrate, which are heated to different temperatures using polarized light. This technique allows for differential heating of semiconductor structures made from different materials, such as germanium and silicon.
Career Highlights
Janusz has worked with esteemed organizations such as Imec and Katholieke Universiteit Leuven. His experience in these institutions has allowed him to develop and refine his innovative techniques in semiconductor technology and microstructure measurement.
Collaborations
Throughout his career, Janusz has collaborated with notable professionals in his field, including Wilfried B Vandervorst and Trudo Clarysse. These collaborations have further enhanced his research and development efforts.
Conclusion
Janusz Bogdanowicz is a distinguished inventor whose work in microstructure measurement and semiconductor technology continues to influence the industry. His innovative patents and collaborations reflect his commitment to advancing technology and improving measurement techniques.