Eindhoven, Netherlands

Jannis P Van Der Linde


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: **Innovator Profile: Jannis P Van Der Linde**

Introduction

Jannis P Van Der Linde is an accomplished inventor based in Eindhoven, Netherlands. With a focus on precision measurement technologies, he has made significant contributions to the field through his inventive work at U.S. Philips Corporation.

Latest Patents

Jannis P Van Der Linde holds a patent for an innovative device aimed at optical velocity measuring with efficient use of radiation passing. This patented technology describes a device designed to measure the angular velocity of a rotating object. It comprises a first disc that moves with the object, featuring a rotationally symmetrical pattern of interruptions, and a second disc with a similar pattern along with a detector. The detector receives radiation that passes through these patterns and converts it into an electric measuring signal. This device is noted for its accuracy, reliability, and compact design. Additionally, it can measure the linear velocity of elongated objects, such as recording tape.

Career Highlights

Jannis has dedicated his professional journey to advancing technology in optical measurements. His role at U.S. Philips Corporation has enabled him to work on state-of-the-art innovations that push the boundaries of existing measurement techniques.

Collaborations

Throughout his career, Jannis has collaborated with esteemed colleagues, including Everardus T Turk and Gerard Van Engelen. These collaborations have played a crucial role in fostering an innovative environment, allowing for the exchange of ideas and the enhancement of technologies in measurement systems.

Conclusion

Jannis P Van Der Linde exemplifies the spirit of innovation through his contributions to optical measurement devices. With his patent and continued work at U.S. Philips Corporation, he remains a significant figure in the field, continuously striving to enhance the accuracy and reliability of technological measurements.

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