Janina Schulz

Title: Janina Schulz: Innovator in Charged Particle Microscopy

Introduction

Janina Schulz is a prominent inventor based in Munich, Germany. She has made significant contributions to the field of charged particle microscopy, holding 2 patents that showcase her innovative approach to this advanced technology.

Latest Patents

Her latest patents include a method of operating a charged particle microscope. This method involves providing settings for focus, x-stigmator, and y-stigmator of the microscope. The process includes repeatedly adjusting the microscope to these settings, recording images of objects, and determining a sharpness measure from the recorded images. The sharpness measure is derived from the orientation of intensity gradients at various locations within the recorded and processed images. This innovative approach enhances the operational efficiency of charged particle microscopes.

Career Highlights

Janina Schulz is currently employed at Carl Zeiss Microscopy GmbH, a leading company in the field of microscopy. Her work focuses on advancing the capabilities of charged particle microscopes, contributing to the development of cutting-edge imaging technologies.

Collaborations

She collaborates with talented coworkers, including Simon Diemer and Emanuel Heindl, who share her passion for innovation in microscopy.

Conclusion

Janina Schulz is a trailblazer in the field of charged particle microscopy, with her patents reflecting her commitment to advancing scientific imaging techniques. Her contributions are paving the way for future innovations in this critical area of research.