Janet S Kania

Title: Janet S. Kania: Innovator in Fatigue Crack Detection

Introduction

Janet S. Kania is a notable inventor based in Cincinnati, OH (US). She has made significant contributions to the field of defect detection in workpieces, particularly through her innovative methods and apparatuses. Her work is essential in ensuring the integrity and safety of various materials used in engineering and manufacturing.

Latest Patents

Janet holds 1 patent for her invention titled "Apparatus and method for detecting fatigue cracks using infrared." This patent describes a method and apparatus for detecting defects in a workpiece. The workpiece is positioned so that its surface is in the optical path of an infrared radiation detector. A selected portion of the workpiece is heated by scanning with electromagnetic radiation for a specific duration, which causes an increase in radiance from any defect present. This method allows for the detection and distinction of defects that may cause failure from minor surface anomalies by analyzing the transient response of the irradiance received by the infrared radiation detector.

Career Highlights

Janet has had a distinguished career, working at General Electric Company, where she has applied her expertise in engineering and innovation. Her work has contributed to advancements in safety and reliability in various applications.

Collaborations

Throughout her career, Janet has collaborated with notable colleagues, including John W. Devitt and Thomas E. Bantel. These collaborations have further enhanced her contributions to the field and have fostered a spirit of innovation within her team.

Conclusion

Janet S. Kania is a pioneering inventor whose work in detecting fatigue cracks has significant implications for engineering and manufacturing. Her innovative approach continues to influence the industry and ensure the safety of workpieces.