Traunstein, Germany

Jürgen Thiel

This inventor holds 2 USPTO granted patents. Top assignees: Dr. Johannes Heidenhain Gmbh, Johannes Heidenhain Gmbh. Active years: 2001-2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jürgen Thiel. Retrieved from https://idiyas.com/inventor/janduumlrgen-thiel

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 25(Granted Patents)


Location History:

  • Surberg, DE (2001)
  • Traunstein, DE (2003)

Company Filing History:


Years Active: 2001-2003

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2 patents (USPTO):Explore Patents

Title: Jürgen Thiel: Innovator in Optical Position Measurement

Introduction

Jürgen Thiel is a notable inventor based in Traunstein, Germany. He has made significant contributions to the field of optical position measurement, holding a total of 2 patents. His work focuses on developing advanced systems that enhance the accuracy and efficiency of position measurement.

Latest Patents

Thiel's latest patents include an "Optical Position Measuring Device with a Beam Splitter." This innovative device is designed to determine the position of two parts that move relatively to one another in the measuring direction. It features a light source and a beam-splitter element that divides the emitted beam into at least one first and one second beam component, which are oriented parallel after leaving the beam-splitter. The device also includes a reference reflector and a measuring reflector, which work together to produce a reference pulse signal.

Another significant patent is the "Position Measuring System and Method for Operating a Position Measuring System." This system determines the relative positions of two objects that can move with respect to each other. It provides phase-shifted analog incremental signals during relative movement and allows for a variation of the signal periods by a signal period variation factor. The system also incorporates correction means to eliminate various errors in the output signals.

Career Highlights

Throughout his career, Jürgen Thiel has worked with esteemed companies such as Johannes Heidenhain GmbH and Dr. Johannes Heidenhain GmbH. His experience in these organizations has contributed to his expertise in optical measurement technologies.

Collaborations

Thiel has collaborated with notable professionals in his field, including Erwin Spanner and Rainer Hagl. These collaborations have further enriched his work and innovations in position measurement systems.

Conclusion

Jürgen Thiel's contributions to optical position measurement demonstrate his commitment to innovation and excellence in engineering. His patents reflect a deep understanding of the complexities involved in accurate position determination, making him a significant figure in this technological domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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