This inventor holds 1 USPTO granted patent. Top assignee: Infineon Technologies Ag. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Jan Ten Bröke: Innovator in Digital Semiconductor Testing
Introduction
Jan Ten Bröke is a notable inventor based in Zwolle, Netherlands. He has made significant contributions to the field of digital semiconductor testing. His innovative approach has led to the development of a unique test circuit that enhances the efficiency of testing digital semiconductor circuit configurations.
Latest Patents
Jan Ten Bröke holds a patent for a "Test circuit for testing a digital semiconductor circuit configuration." This monolithically integrated test circuit is designed for testing digital semiconductor circuit configurations formed on the same semiconductor chip. It features a large number of elements to be tested. The test circuit includes a test data pattern register for temporary storage of a test data pattern, a read and write circuit for managing data flow, and a comparison circuit that checks for discrepancies between written and read data. Additionally, the circuit incorporates a pattern variation circuit, which can be activated to modify the test data pattern before it is written into the elements being tested. He has 1 patent to his name.
Career Highlights
Jan Ten Bröke is currently employed at Infineon Technologies AG, where he continues to work on advancements in semiconductor technology. His expertise in digital circuits has positioned him as a valuable asset in the industry.
Collaborations
Jan has collaborated with notable colleagues, including Dominique Savignac and Wolfgang Nikutta. Their combined efforts contribute to the innovative projects at Infineon Technologies AG.
Conclusion
Jan Ten Bröke's contributions to digital semiconductor testing exemplify the impact of innovation in technology. His work continues to influence the field and improve testing methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
