This inventor holds 1 USPTO granted patent. Top assignee: Krohne Messtechnik Gmbh. Active years: 2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2022
Title: Jan Tebrügge: Innovator in Measurement Technology
Introduction
Jan Tebrügge is a notable inventor based in Dortmund, Germany. He has made significant contributions to the field of measurement technology, particularly with his innovative patent that enhances the accuracy and efficiency of measuring devices.
Latest Patents
Jan Tebrügge holds a patent for a "Measuring device and method for time-resolved measurement of a measuring signal." This device is designed for the time-resolved measurement of a measurement signal and allows for the temporal separation of at least a first portion of the measurement signal. The device includes a light source that emits a pulsed excitation signal, at least one detector that receives the measurement signal, and generates a detector signal from it. Additionally, it features a first forming unit for generating a first comparison signal, which correlates with the excitation signal. The invention also incorporates a logic function that links the first comparison signal with a signal dependent on the detector signal, providing a measure of the intensity of the first portion of the measurement signal.
Career Highlights
Jan Tebrügge is currently employed at Krohne Messtechnik GmbH, a company renowned for its expertise in measurement technology. His work at Krohne has allowed him to apply his innovative ideas and contribute to the development of advanced measuring devices.
Collaborations
Throughout his career, Jan has collaborated with talented individuals such as Jan Förster and Thomas Fritsch. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.
Conclusion
Jan Tebrügge is a distinguished inventor whose work in measurement technology has led to significant advancements in the field. His patent reflects his commitment to innovation and his ability to solve complex measurement challenges.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
