This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1995.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1995
Title: Jan Sikora - Innovator in Material Moisture Measurement
Introduction
Jan Sikora is a notable inventor based in Munich, Germany. He has made significant contributions to the field of material moisture measurement through his innovative patent. His work focuses on utilizing advanced technology to enhance the accuracy of moisture content detection in various materials.
Latest Patents
Jan Sikora holds a patent for a method that measures the material moisture content of a test object using microwaves. This process involves a device that determines the moisture content by measuring properties of a resonator, such as resonance frequency, resonance half-width value, and amplitude of the resonance. The technology allows for precise measurements of moisture content, independent of the material's density and largely unaffected by the type of material or changes in additives. The measurement equipment can be utilized without hardware rearrangement, effectively covering moisture contents from the ppm range to levels exceeding 80%. Additionally, the shape of the sample does not impose special requirements, making this method versatile.
Career Highlights
Throughout his career, Jan Sikora has demonstrated a commitment to innovation and excellence in his field. His patent reflects his expertise and dedication to improving measurement techniques, which can have significant implications in various industries.
Collaborations
Jan has collaborated with esteemed colleagues, including Rainer Herrmann and Manfred Tews. Their combined efforts contribute to the advancement of technology in material measurement.
Conclusion
Jan Sikora is a distinguished inventor whose work in measuring material moisture content showcases his innovative spirit and technical expertise. His contributions are valuable to the field and highlight the importance of precision in material analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile