Vlaardingen, Netherlands

Jan Siebesma

This inventor holds 1 USPTO granted patent. Top assignee: Internationale Octrooi Maatschappij 'Octropa' Bv. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jan Siebesma. Retrieved from https://idiyas.com/inventor/jan-siebesma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jan Siebesma

Introduction

Jan Siebesma is a notable inventor based in Vlaardingen, Netherlands. He has made significant contributions to the field of technology, particularly with his innovative patent that assists in the visual assessment of test objects. His work reflects a commitment to enhancing the capabilities of visual assessment tools.

Latest Patents

Jan Siebesma holds a patent for an "Apparatus for assisting the visual assessment of test objects." This invention showcases his ability to address practical challenges in visual assessment, providing a valuable tool for various applications.

Career Highlights

Siebesma is associated with Internationale Octrooi Maatschappij 'Octropa' Bv, where he has been able to apply his inventive skills. His career is marked by a focus on developing technologies that improve assessment processes.

Collaborations

Throughout his career, Jan has collaborated with notable colleagues, including John W. Chidlow and Jan Van Duijn. These partnerships have likely contributed to the development and refinement of his innovative ideas.

Conclusion

Jan Siebesma's contributions to the field of invention, particularly through his patent, highlight his role as a significant figure in technological advancements. His work continues to influence the way visual assessments are conducted.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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