Gaimersheim, Germany

Jan MuEnchhoff

This inventor holds 1 USPTO granted patent. Top assignee: Volkswagen Ag. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jan MuEnchhoff. Retrieved from https://idiyas.com/inventor/jan-muenchhoff

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Jan MuEnchhoff: Innovator in Roadway Surface Condition Detection

Introduction

Jan MuEnchhoff is a notable inventor based in Gaimersheim, Germany. He has made significant contributions to the field of roadway condition assessment through his innovative inventions. His work primarily focuses on developing devices that enhance the safety and efficiency of roadways.

Latest Patents

Jan MuEnchhoff holds 1 patent for a device designed to determine the surface condition of a roadway. This device utilizes a light-sensitive sensor to measure light signals reflected from the roadway surface. The analyzer within the device assesses the surface condition based on the power of the light signals at multiple infrared wavelengths.

Career Highlights

Jan MuEnchhoff is currently employed at Volkswagen AG, where he applies his expertise in developing advanced technologies for automotive applications. His work at Volkswagen AG reflects his commitment to innovation and improving roadway safety.

Collaborations

Jan has collaborated with talented individuals such as Cedric Dupont and Arne Stoschek. These collaborations have contributed to the advancement of technology in the automotive sector.

Conclusion

Jan MuEnchhoff is a dedicated inventor whose work in roadway surface condition detection showcases his innovative spirit and commitment to enhancing road safety. His contributions are valuable to the automotive industry and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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