Company Filing History:
Years Active: 2025
Title: Jan Lásko: Innovator in Charged Particle Sensors
Introduction
Jan Lásko is a notable inventor based in Zatcany, Czech Republic. He has made significant contributions to the field of charged particle sensors, particularly through his innovative patent. His work focuses on enhancing the capabilities of scanning electron microscopes (SEM) with advanced sensor technology.
Latest Patents
Jan Lásko holds a patent for "Charged particle sensors including wide bandgap materials." This patent describes charged particle microscopy systems, sensors, and techniques that improve the functionality of charged particle sensors. The design includes a housing that can be integrated into a scanning electron microscope. The sensor features a detector cell that is mechanically coupled with the housing. This detector cell incorporates an acceptor layer made of a semiconducting material with a bandgap of at least 2.0 eV. The configuration includes a first conducting layer on one surface and a second conducting layer on the opposing surface, along with electrical contacts for enhanced performance.
Career Highlights
Jan Lásko is currently employed at FEI Company, where he continues to develop cutting-edge technologies in the field of microscopy. His expertise in charged particle sensors has positioned him as a key player in advancing the capabilities of electron microscopy.
Collaborations
Jan has collaborated with talented coworkers such as Branislav Straka and Libor Novák. Their combined efforts contribute to the innovative environment at FEI Company, fostering advancements in microscopy technology.
Conclusion
Jan Lásko's work in charged particle sensors exemplifies the innovative spirit of modern inventors. His contributions are paving the way for enhanced microscopy techniques that will benefit various scientific fields.