Company Filing History:
Years Active: 1977
Title: Jan Hendrik De Jonge: Innovator in Digital Memory Testing
Introduction
Jan Hendrik De Jonge is a notable inventor based in Beekbergen, Netherlands. He has made significant contributions to the field of digital memory testing. His innovative approach has led to the development of a unique method and device for testing integrated memories.
Latest Patents
De Jonge holds a patent for a "Method of and device for testing a digital memory." This invention provides a compact test sequence for testing integrated memories. The process involves filling all storage positions with the bit '0', followed by a systematic reading and writing of '1' bits. The method ensures thorough testing by reading and writing in a predetermined order, which can be modified through cyclic rotation. This innovative approach enhances the reliability of digital memory testing.
Career Highlights
Jan Hendrik De Jonge is associated with U.S. Philips Corporation, where he has contributed to advancements in technology. His work has been instrumental in improving the efficiency and effectiveness of memory testing processes.
Collaborations
De Jonge has collaborated with Adrianus Josephus Smulders, working together to enhance the development of testing methodologies in digital memory.
Conclusion
Jan Hendrik De Jonge's contributions to digital memory testing exemplify the spirit of innovation. His patent reflects a deep understanding of integrated memory systems and showcases his commitment to advancing technology.