Vaster.ang.s, Sweden

Jan Beijbom

This inventor holds 1 USPTO granted patent. Top assignee: Asea Brown Boveri Ab. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jan Beijbom. Retrieved from https://idiyas.com/inventor/jan-beijbom

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1998

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jan Beijbom: Innovator in Force Measurement Technology

Introduction

Jan Beijbom is a notable inventor based in Vasterängs, Sweden. He has made significant contributions to the field of force measurement technology. His innovative approach has led to the development of a unique patent that enhances measurement accuracy.

Latest Patents

Jan Beijbom holds a patent for a "Method and a device for two-shaft force measurement and its application." This invention showcases his expertise in creating solutions that address complex measurement challenges. The patent reflects his commitment to advancing technology in this area.

Career Highlights

Beijbom is associated with Asea Brown Boveri AB, a company known for its engineering excellence. His work at the company has allowed him to apply his innovative ideas in practical settings. His contributions have been instrumental in the development of advanced measurement systems.

Collaborations

Jan Beijbom has collaborated with Jarl R. Sobel, further enhancing the impact of his work. Their partnership has fostered innovation and led to the successful implementation of new technologies.

Conclusion

Jan Beijbom's contributions to force measurement technology exemplify his dedication to innovation. His patent and work at Asea Brown Boveri AB highlight his role as a leading inventor in this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…