Tomball, TX, United States of America

James W Strong

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James W Strong. Retrieved from https://idiyas.com/inventor/james-w-strong

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 51(Granted Patents)


Company Filing History:

goldMedal1 out of 834,601 
Other
 patents

Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Innovations by James W Strong

Introduction

James W Strong is an accomplished inventor based in Tomball, TX (US). He has made significant contributions to the field of manufacturing and inspection technology. His innovative approach focuses on enhancing the efficiency and accuracy of data collection during the testing and inspection of manufactured products.

Latest Patents

James W Strong holds a patent for a "Method and apparatus for data collection of testing and inspection." This invention provides a method and apparatus that enables real-time recording and analysis of defects in manufactured products. It expedites the identification and correction of errors in production and assembly operations. The patent is particularly useful in scenarios where multiple parts are used to create various units of a device, typically involving the assembly of components into a printed circuit board. The invention supports fully integrated multiple inspection stations, which include terminals that utilize light pens and screens for inputting codes that classify defects. Additionally, it captures defect data from automatic testing equipment, providing real-time output of defect indications and trends.

Career Highlights

Throughout his career, James W Strong has demonstrated a commitment to innovation in manufacturing processes. His work has significantly impacted the efficiency of production lines, allowing for quicker identification of defects and reducing waste. His patent reflects his dedication to improving manufacturing quality and operational efficiency.

Collaborations

James has collaborated with notable colleagues, including Pamela K Schuster and Marvin C Conrad. Their combined expertise has contributed to advancements in the field of manufacturing inspection technologies.

Conclusion

James W Strong's innovative contributions to data collection and inspection methods have made a lasting impact on the manufacturing industry. His patent showcases his ability to address complex challenges in production and assembly operations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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