Carbondale, CO, United States of America

James T Woolaway

This inventor holds 1 USPTO granted patent. Top assignee: Resideo USA LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James T Woolaway. Retrieved from https://idiyas.com/inventor/james-t-woolaway-fkb803n4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: James T. Woolaway and AI Data Labeling

Introduction

James T. Woolaway is an inventor associated with Carbondale, Colorado, and Resideo USA LLC. His patent work addresses a practical challenge in artificial intelligence: helping deployed AI models learn to recognize events they initially classify as unknown or anomalous.

Latest Patents

Woolaway is credited with 1 patent: “Systems for Application Enhanced Data Labeling for AI Training and Methods Thereof.” The invention describes a smartphone application that connects users to information about critical events, supports labeling those events, and facilitates model retraining. When an AI-enabled product encounters an unrecognized event in a residential or commercial setting, the event and its associated data can be identified and labeled. That information can then help retrain the model so it can recognize similar events in the future.

Career Highlights

Woolaway’s listed patent highlights an approach to improving AI systems after deployment. By linking event information, human labeling, and model retraining through a smartphone application, the invention aims to make it easier to address unexpected or anomalous detections in products already in use.

Collaborations

Woolaway is associated with Resideo USA LLC. His listed coworkers include Andrew Blohm and Louis Tremblay.

Conclusion

James T. Woolaway’s patent focuses on a practical feedback process for AI training, using event labeling and retraining to help deployed models better recognize unfamiliar events.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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