Ann Arbor, MI, United States of America

James T Eckner

This inventor holds 1 USPTO granted patent. Top assignee: University of Michigan. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James T Eckner. Retrieved from https://idiyas.com/inventor/james-t-eckner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Innovations by James T Eckner

Introduction

James T Eckner is an accomplished inventor based in Ann Arbor, MI. He is known for his contributions to the field of neurological testing. His innovative approach has led to the development of a unique device that measures reaction time.

Latest Patents

Eckner holds a patent for a "Device and method for measuring reaction time." This manual neurological testing device is designed to measure a subject's reaction time. It comprises a releasable holding member that the subject can grasp, a stimulus device that outputs a perceivable stimulus, and a measurement device that records the subject's reaction time in relation to the stimulus.

Career Highlights

James T Eckner is affiliated with the University of Michigan, where he continues to advance his research and innovations. His work has significant implications for the field of neurological assessments and testing methodologies.

Collaborations

Eckner has collaborated with notable colleagues, including James A Ashton-Miller and Hogene Kim. Their combined expertise enhances the research and development of innovative solutions in their field.

Conclusion

James T Eckner's contributions to the field of neurological testing through his patented device exemplify the importance of innovation in medical technology. His work continues to influence the way reaction times are measured and assessed.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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