San Jose, CA, United States of America

James Stephen Paine

This inventor holds 1 USPTO granted patent. Top assignee: Altera Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Stephen Paine. Retrieved from https://idiyas.com/inventor/james-stephen-paine

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovations of James Stephen Paine

Introduction

James Stephen Paine is a notable inventor based in San Jose, CA. He has made significant contributions to the field of integrated circuit testing. His innovative approach has led to the development of a unique patent that enhances the efficiency of testing processes.

Latest Patents

James holds a patent for a "Touchdown counter for integrated circuit testers." This invention maintains a count of how many times integrated circuits are placed into contact with a contactor in a test handler. The touch-down counter utilizes a non-contact Hall effect sensor attached to the contactor, which detects the presence of a magnet affixed to the work press. This system allows for a lifetime count of touch-down events, enabling operators to determine when cleaning is necessary.

Career Highlights

James is currently employed at Altera Corporation, where he continues to innovate in the field of integrated circuits. His work has been instrumental in improving testing methodologies and ensuring the longevity of testing equipment.

Collaborations

James has collaborated with notable colleagues, including Ronald M Beach and Joseph W Foerstel, contributing to advancements in their shared field of expertise.

Conclusion

James Stephen Paine's contributions to integrated circuit testing through his innovative patent demonstrate his commitment to enhancing technology in this area. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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