James Sharier

Title: The Innovations of James Sharier

Introduction

James Sharier is an accomplished inventor based in Pflugerville, TX (US). He has made significant contributions to the field of manufacturing through his innovative ideas and patents. His work focuses on enhancing the efficiency and performance of manufacturing entities.

Latest Patents

James Sharier holds a patent for a "Statistical process control system with normalized control charting." This invention provides a method for monitoring the performance of a manufacturing entity. The process involves retrieving metrology data that indicates an output parameter of the manufacturing entity, which has an associated target value. The metrology data is then normalized based on this target value to generate normalized performance data points. A performance rule violation is determined based on the normalized performance data. This system includes a metrology tool, a first database, and a processor, all working together to ensure optimal performance in manufacturing processes.

Career Highlights

James Sharier is currently employed at Advanced Micro Devices Corporation, a leading company in the semiconductor industry. His role involves applying his expertise in statistical process control to improve manufacturing processes. His innovative approach has contributed to the company's reputation for quality and efficiency.

Collaborations

James has worked alongside talented colleagues such as Brian K Cusson and Justin Giguere. Their collaborative efforts have fostered an environment of innovation and creativity within their projects.

Conclusion

James Sharier's contributions to the field of manufacturing through his patent and work at Advanced Micro Devices Corporation highlight his role as a significant inventor. His innovative methods for monitoring manufacturing performance continue to influence the industry positively.