Tucson, AZ, United States of America

James Scott Mason

This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Scott Mason. Retrieved from https://idiyas.com/inventor/james-scott-mason

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: James Scott Mason: Innovator in Integrated Circuit Testing

Introduction

James Scott Mason is a notable inventor based in Tucson, AZ (US). He has made significant contributions to the field of integrated circuit testing, showcasing his expertise through his innovative patent.

Latest Patents

Mason holds a patent for an "Integrated circuit spike check probing apparatus and method." This apparatus is designed to cooperate with a stationary integrated circuit test board. It includes a frame for positioning relative to the test board, which is used for coupling to an integrated circuit device under test. The apparatus features a probe with a tip and a processor-controlled actuator that moves the probe tip to selectively contact a test point on the integrated circuit test board.

Career Highlights

James Scott Mason is currently employed at Texas Instruments Corporation, a leading company in the semiconductor industry. His work focuses on enhancing the efficiency and accuracy of integrated circuit testing.

Collaborations

Mason collaborates with talented coworkers, including Neeraj Bhardwaj and Madhusudan Sampath, contributing to innovative projects within the company.

Conclusion

James Scott Mason's contributions to integrated circuit testing through his patent and work at Texas Instruments Corporation highlight his role as an influential inventor in the technology sector. His innovative spirit continues to drive advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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