Shepshed, United Kingdom

James Richards

This inventor holds 1 USPTO granted patent. Top assignee: Campbell Scientific, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Richards. Retrieved from https://idiyas.com/inventor/james-richards-h7y5xuj7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: James Richards and Photovoltaic Soiling Monitoring

Introduction

James Richards is an inventor associated with Shepshed, Great Britain, and Campbell Scientific, Inc. His patent work addresses monitoring soiling on monofacial and bifacial photovoltaic panels, helping assess how accumulated dirt affects solar-module performance.

Latest Patents

Richards is associated with 1 patent: “Sensors and Methods for Monitoring Soiling on Monofacial and Bifacial Photovoltaic Panels.” The patent describes systems and methods for monitoring soiling on one or more photovoltaic modules.

The sensor includes a measure chamber and a clean chamber. Cells in the measure chamber provide readings affected by soiling, while reference cells can be exposed to incident light outside the clean chamber to establish a clean output. Comparing the readings makes it possible to determine soiling-related losses.

Career Highlights

Richards’s listed invention focuses on measuring the impact of soiling on photovoltaic panels. The approach uses a comparison between soiled measurements and a clean reference to help evaluate changes in module output.

Collaborations

Richards is associated with Campbell Scientific, Inc. His listed coworkers include Ajay Singh and Kris K. Payne.

Conclusion

James Richards’s patent work contributes a sensor-based method for assessing soiling losses in photovoltaic modules, supporting more informed monitoring of solar-panel performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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