Company Filing History:
Years Active: 2005-2016
Title: Innovations of James R Von Ehr
Introduction
James R Von Ehr is a notable inventor based in Richardson, TX (US). He has made significant contributions to the field of nanotechnology, holding 2 patents that showcase his innovative approaches to forming atomically precise structures.
Latest Patents
One of his latest patents is titled "Methods, devices, and systems for forming atomically precise structures." This patent describes methods that utilize a scanning tunneling microscope (STM) to remove portions of a monolayer of atoms or molecules from a crystalline surface. The STM is employed to both image the sample and facilitate the removal of specific atoms or molecules. The lattice structure of the crystalline surface serves as a coordinate system for the STM's control system, enabling automated removal processes.
Another significant patent is "Directional assembly of carbon nanotube strings." In this invention, a solution containing randomized nanotubes is introduced into a channelized mold, which is then dried. This process results in parallel nanotubes being stretched across the walls of the channel. The design of the channel allows for controlled nanotube lengths, and the mold can be positioned to transfer the constructed nanotubes to another structure.
Career Highlights
James R Von Ehr has worked with Zyvex Corporation and Zyvex Labs, LLC, where he has furthered his research and development in nanotechnology. His work has been instrumental in advancing the understanding and application of nanostructures.
Collaborations
James has collaborated with notable individuals in his field, including Jian Chen and John Neal Randall. Their combined expertise has contributed to the success of various projects and innovations.
Conclusion
James R Von Ehr's contributions to nanotechnology through his patents and career highlights demonstrate his commitment to innovation. His work continues to influence the field and inspire future advancements in technology.