The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 03, 2016

Filed:

Mar. 13, 2014
Applicant:

Zyvex Labs, Llc, Richardson, TX (US);

Inventors:

John Neal Randall, Richardson, TX (US);

James R. Von Ehr, Richardson, TX (US);

James H. G. Owen, Garland, TX (US);

Joshua B. Ballard, Richardson, TX (US);

Ehud Fuchs, Plano, TX (US);

Assignee:

Zyvex Labs LLC, Richardson, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B82B 3/00 (2006.01); G01Q 60/10 (2010.01); G01Q 90/00 (2010.01); G01Q 20/00 (2010.01); G01Q 10/00 (2010.01); G01Q 80/00 (2010.01);
U.S. Cl.
CPC ...
G01Q 20/00 (2013.01); B82B 3/0038 (2013.01); G01Q 10/00 (2013.01); G01Q 60/10 (2013.01); G01Q 80/00 (2013.01); H01J 2237/31759 (2013.01);
Abstract

Methods, devices, and systems for forming atomically precise structures are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a scanning tunneling microscope (STM) to remove portions of a monolayer of atoms or molecules from a crystalline surface to form atomically precise structures. The STM is utilized to both image the sample and remove the desired portions of the monolayer of atoms or molecules. In some instances, the lattice structure of the crystalline surface is utilized as a coordinate system by a control system of the STM to facilitate the automated removal of specific atoms or molecules from the crystalline surface.


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