Amherst, NH, United States of America

James R Lynch, Iii

This inventor holds 1 USPTO granted patent. Top assignee: Bae Systems Information and Electronic Systems Integration Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James R Lynch, Iii. Retrieved from https://idiyas.com/inventor/james-r-lynch-iii

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: James R. Lynch, III: Innovator in Optics

Introduction

James R. Lynch, III is a notable inventor based in Amherst, NH (US). He has made significant contributions to the field of optics, particularly with his innovative designs that enhance optical assemblies. His work is characterized by a focus on practical applications that improve technology in various sectors.

Latest Patents

Lynch holds a patent for a "Bullet lens design for the dasal seeker." This patent features an optic assembly that includes a bullet collection lens and a plurality of fiber optic bundles, which are arranged parallel to a central channel. This design is crucial for enhancing the performance of optical systems.

Career Highlights

Lynch is associated with BAE Systems Information and Electronic Systems Integration Inc., where he applies his expertise in optics to develop advanced technologies. His career reflects a commitment to innovation and excellence in engineering.

Collaborations

Throughout his career, Lynch has collaborated with talented individuals such as Carl Alan Way and Marcus Hatch. These partnerships have contributed to the successful development of various projects and innovations.

Conclusion

James R. Lynch, III is a distinguished inventor whose work in optics has led to significant advancements in technology. His contributions continue to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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