This inventor holds 1 USPTO granted patent. Top assignee: Combustion Engineering, Inc.. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: Innovations of James P. Sutton, III
Introduction
James P. Sutton, III is an accomplished inventor based in Middletown, CT (US). He has made significant contributions to the field of particle size measurement technology. His innovative approach has led to the development of a unique device that enhances the accuracy of measuring particle characteristics in fluid substances.
Latest Patents
James P. Sutton, III holds a patent for an "In situ particle size measuring device." This device is designed to simultaneously measure two critical parameters of particles present in a fluid: particle size distribution and volumetric density. The device utilizes a laser light source, a laser light conveying device, and a series of focusing devices to analyze the particles as they pass through a defined sample path. The operation of the device allows for the collection of both scattered and collimated light, which is then analyzed to infer particle size distribution and calculate volumetric density.
Career Highlights
James P. Sutton, III is associated with Combustion Engineering, Inc., where he has applied his expertise in developing advanced measurement technologies. His work has been instrumental in improving the efficiency and accuracy of particle size analysis in various applications.
Collaborations
James P. Sutton, III has collaborated with his coworker, James M. Niziolek, to further enhance the capabilities of their innovative technologies. Their combined efforts have contributed to advancements in the field of particle measurement.
Conclusion
James P. Sutton, III is a notable inventor whose work in particle size measurement technology has made a significant impact. His patented device exemplifies innovation in the field, showcasing his dedication to advancing measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile