Dix Hills, NY, United States of America

James P Blumling

This inventor holds 1 USPTO granted patent. Top assignee: Telephonics Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James P Blumling. Retrieved from https://idiyas.com/inventor/james-p-blumling

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: James P. Blumling: Innovator in Radar Detection Technology

Introduction

James P. Blumling is a notable inventor based in Dix Hills, NY (US). He has made significant contributions to the field of radar technology, particularly in the area of target detection. His innovative approach has led to the development of a unique method that enhances the accuracy and efficiency of radar systems.

Latest Patents

James P. Blumling holds a patent for a "Method for detecting a target." This invention describes an improved radar system and method for detecting targets. The invention discriminately detects and analyzes a target by sub-dividing it into sections. In combination with a sliding window integrator, it assimilates accumulated high-resolution channel and low-resolution channel data to construct a complete image. This patent showcases his expertise and commitment to advancing radar technology.

Career Highlights

James P. Blumling is currently associated with Telephonics Corporation, where he applies his skills and knowledge to further develop innovative radar solutions. His work at the company has positioned him as a key player in the field of radar technology.

Collaborations

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Conclusion

James P. Blumling's contributions to radar detection technology exemplify his innovative spirit and dedication to improving systems that enhance target detection. His work continues to influence advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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