Berkeley, CA, United States of America

James O'Brien

This inventor holds 1 USPTO granted patent. Top assignee: Fourandsix Technologies, Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James O'Brien. Retrieved from https://idiyas.com/inventor/james-o-brien-2nekjsux

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of James O'Brien

Introduction

James O'Brien is a notable inventor based in Berkeley, CA. He has made significant contributions to the field of image processing. His work focuses on detecting inconsistencies in image components, which has important applications in various technologies.

Latest Patents

James O'Brien holds a patent for "Detecting Image Inconsistencies." This patent discloses a method for determining the consistency of image components. The process involves receiving a first constraint related to a possible convergence area of a first component and a second constraint for a second component. These constraints are utilized to assess whether the two components are consistent with each other. He has 1 patent to his name.

Career Highlights

O'Brien is currently employed at Fourandsix Technologies, Inc., where he continues to innovate in the field of image processing. His work has garnered attention for its potential to enhance image analysis technologies.

Collaborations

Some of his notable coworkers include Eric R Kee and Hany Farid. Their collaborative efforts contribute to the advancement of technology in image processing.

Conclusion

James O'Brien is a dedicated inventor whose work in detecting image inconsistencies showcases his innovative spirit. His contributions to the field are paving the way for future advancements in image technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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