This inventor holds 2 USPTO granted patents. Top assignee: Lockheed Martin Corporation. Active years: 2005-2011.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2005-2011
Title: James M. Stana: Inventor in Structural Monitoring and Window Evaluation
Introduction
James M. Stana is an inventor associated with Orlando, Florida, and Lockheed Martin Corporation. His patent work includes methods for evaluating window transmission loss and recording changes related to a structure’s acceleration. He is credited with 2 patents.
Latest Patents
Stana’s listed patents address practical measurement and monitoring challenges.
“Portable Evaluation of Window Transmission” describes an apparatus and method for estimating a window’s transmission loss. The method uses photographs taken through a filter, determines the percentage of each image showing undamaged portions of the window, and calculates an estimate based on those percentages.
“Method and Apparatus for Recording Changes Associated with Acceleration of a Structure” concerns recording changes linked to structural acceleration. Its described embodiment uses an accelerometer array, nonvolatile memory, a clock timer, and a programmable control unit. These components may be integrated on a common semiconductor substrate, with the accelerometer array positioned in a central region.
Career Highlights
Stana’s patent portfolio reflects work on both portable evaluation techniques and electronic systems for recording structural behavior. His association with Lockheed Martin Corporation provides the organizational context for his listed inventive work.
Collaborations
The supplied information identifies Kevin F. Williams and Ronald H. Gilmore as Stana’s coworkers. It does not specify their roles in the patents or establish that they were co-inventors.
Conclusion
James M. Stana’s two listed patents focus on assessing window transmission and capturing acceleration-related changes in structures, illustrating his contributions to measurement and monitoring technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
