Longmont, CO, United States of America

James M Forbis

This inventor holds 4 USPTO granted patents. Top assignees: Veeco Instruments Inc., Nutronics, Inc., Optek Research Partners Limited. Active years: 1985-2003.


% Patents Active = 75.0

Average Co-Inventor Count = 2.2

ph-index = 2

Forward Citations = 43(Granted Patents)


Company Filing History:


Years Active: 1985-2003

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4 patents (USPTO):Explore Patents

Title: The Innovations of James M. Forbis

Introduction

James M. Forbis is a notable inventor based in Longmont, CO (US). He has made significant contributions to the field of technology, holding a total of 4 patents. His work primarily focuses on advancements in probe card technology, which plays a crucial role in the testing of electronic devices.

Latest Patents

One of his latest patents is a vertical probe card for attachment within a central corridor of a magnetic field generator. This innovative vertical probe card assembly contains multiple vertical probe cards mounted within a central corridor or opening of a magnetic field generator. Each vertical probe card is equipped with a multiplicity of probe needles that extend downwardly to electrically contact the test pads of a device under test positioned below the magnetic field generator.

Career Highlights

Throughout his career, James M. Forbis has worked with several prominent companies, including Veeco Instruments Inc. and Optek Research Partners Limited. His experience in these organizations has allowed him to refine his skills and contribute to various technological advancements.

Collaborations

James has collaborated with notable individuals in his field, including Dennis Cahalan and Paul W. Panish. These collaborations have further enriched his work and expanded his impact on the industry.

Conclusion

James M. Forbis is a distinguished inventor whose contributions to probe card technology have made a significant impact in the field. His innovative patents and collaborations highlight his dedication to advancing technology.

Profile summary based on public USPTO records.
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