Crozet, VA, United States of America

James LeRoy Bruce, Jr

This inventor holds 1 USPTO granted patent. Top assignee: Bio-Rad Laboratories, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James LeRoy Bruce, Jr. Retrieved from https://idiyas.com/inventor/james-leroy-bruce-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 19.0

ph-index = 1


Company Filing History:


Years Active: 2025

Loading Chart...
1 patent (USPTO):Explore Patents

Title: James LeRoy Bruce, Jr: Innovator in Diagnostic Instrumentation

Introduction

James LeRoy Bruce, Jr. is an accomplished inventor based in Crozet, Virginia. He has made significant contributions to the field of diagnostic instrumentation, particularly through his innovative designs and patents. His work is instrumental in enhancing the functionality and user experience of diagnostic tools.

Latest Patents

James LeRoy Bruce, Jr. holds a patent for a display screen or portion thereof with a graphical user interface for managing a diagnostic instrument. This patent reflects his commitment to improving the efficiency and usability of diagnostic devices, making them more accessible for users.

Career Highlights

Currently, James is employed at Bio-Rad Laboratories, Inc., a company renowned for its contributions to the life sciences and clinical diagnostics. His role at Bio-Rad allows him to apply his inventive skills in a practical setting, furthering the development of advanced diagnostic solutions.

Collaborations

James has collaborated with notable colleagues, including Gino D. Gonnelli and Christina Marshall. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

James LeRoy Bruce, Jr. exemplifies the spirit of innovation in the field of diagnostic instrumentation. His contributions through patents and collaborations continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…