This inventor holds 1 USPTO granted patent. Top assignee: Duke University. Active years: 2024.
Company Filing History:
Years Active: 2024
Title: Innovations by James L Doherty in Electronic Device Characterization
Introduction
James L Doherty is an accomplished inventor based in Durham, NC (US). He has made significant contributions to the field of electronic device characterization. His innovative work has led to the development of a unique patent that enhances the testing of electronic devices and sensors.
Latest Patents
James L Doherty holds a patent for "Electronic device characterization systems and methods." This patent describes electronic device characterization platforms, systems, devices, and methods for use in testing instruments, devices, and sensors that are portable, modular, multiplexed, and automated. The system includes a substrate, a chip adapter, such as a chip socket, and an optional housing. Chip samples to be tested can be disposed in the chip adapter, and various environmental modules designed to supply different environmental conditions to the chip sample can be disposed over the chip adapter. This enables testing of the chip samples to be performed in different environmental conditions. The system can further include various connectors that allow for add-on modules to be included as part of the system. Methods of characterizing electronic devices and sensors are also disclosed in this patent.
Career Highlights
James L Doherty is affiliated with Duke University, where he continues to contribute to research and innovation in electronic device characterization. His work has garnered attention for its practical applications in testing and characterizing electronic devices.
Collaborations
James has collaborated with notable colleagues, including Aaron Franklin and Steven G Noyce, who share his passion for advancing technology in the field of electronics.
Conclusion
James L Doherty's innovative contributions to electronic device characterization demonstrate his commitment to enhancing testing methodologies in the field. His patent reflects a significant advancement in the capabilities of testing instruments and devices.