Charlotte, VT, United States of America

James J Lynch

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James J Lynch. Retrieved from https://idiyas.com/inventor/james-j-lynch-ytuvcid9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1996

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1 patent (USPTO):Explore Patents

Title: Innovations of James J Lynch in Lithography

Introduction

James J Lynch is a notable inventor based in Charlotte, Vermont. He has made significant contributions to the field of lithography, particularly with his innovative methods for mask repair and fabrication. His work has implications for optical and phase-shift lithography, showcasing his expertise and creativity in this specialized area.

Latest Patents

Lynch holds a patent for a "Lithographic mask repair and fabrication method." This method involves forming a substantially defect-free mask for optical and phase-shift lithography. The process includes depositing a transfer layer on a mask layer that is placed on a transmissive substrate. It further involves creating a mask image in the transfer layer, inspecting this image, repairing any defects, and transferring the corrected image into the mask layer. The repair process is achieved by removing unwanted portions of the transfer layer and filling any voids with a selected material that possesses desirable etching and optical characteristics.

Career Highlights

Lynch is associated with International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to develop and refine his innovative techniques in lithography, contributing to advancements in the field. His patent reflects his commitment to improving the quality and efficiency of lithographic processes.

Collaborations

Throughout his career, Lynch has collaborated with notable colleagues such as William John Adair and David S O'Grady. These collaborations have likely enriched his work and contributed to the development of his patented methods.

Conclusion

James J Lynch's contributions to lithography through his innovative patent demonstrate his expertise and dedication to advancing technology in this field. His work continues to influence the industry and showcases the importance of innovation in engineering and manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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