Albuquerque, NM, United States of America

James J Blanc

This inventor holds 1 USPTO granted patent. Top assignee: Sperry Corporation. Active years: 1987.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James J Blanc. Retrieved from https://idiyas.com/inventor/james-j-blanc-cbgj1hq0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 1987

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1 patent (USPTO):Explore Patents

Title: The Innovations of James J Blanc

Introduction

James J Blanc is an accomplished inventor based in Albuquerque, NM. He has made significant contributions to the field of technology, particularly in the area of cathode ray tube (CRT) display performance. His innovative work has led to the development of a patent that addresses critical issues in power supply control.

Latest Patents

James J Blanc holds a patent for an "Apparatus and method of anode power supply control during vertical retrace." This invention focuses on controlling the anode voltage power supply to reduce fluctuations in output during the vertical retrace period. The result is a marked improvement in overall CRT display performance parameters. He has 1 patent to his name.

Career Highlights

Throughout his career, James has worked with Sperry Corporation, where he has applied his expertise in electrical engineering and technology. His role at the company has allowed him to contribute to various projects that enhance display technologies.

Collaborations

James has collaborated with notable colleagues, including Bryan P Hansen and Dale A Kemper. These partnerships have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

James J Blanc's contributions to technology, particularly in CRT display performance, highlight his role as a significant inventor. His patent and collaborations reflect his commitment to innovation and excellence in engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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