Albuquerque, NM, United States of America

James Hendrie

This inventor holds 1 USPTO granted patent. Top assignee: The University of New Mexico. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Hendrie. Retrieved from https://idiyas.com/inventor/james-hendrie

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: The Innovations of James Hendrie

Introduction

James Hendrie is an accomplished inventor based in Albuquerque, NM. He has made significant contributions to the field of interferometry, particularly through his innovative patent. His work is recognized for its applicability in various advanced technologies.

Latest Patents

James Hendrie holds a patent titled "Enhancement of the phase response of intracavity phase interferometers." This patent focuses on apparatus, systems, and methods that enhance the phase response of these interferometers. The implications of this invention are vast, impacting numerous applications in scientific and engineering fields.

Career Highlights

Hendrie is affiliated with The University of New Mexico, where he continues to engage in research and development. His academic background and professional experience have positioned him as a key figure in his area of expertise.

Collaborations

Throughout his career, James has collaborated with notable colleagues, including Jean-Claude M Diels and Matthias Lenzner. These partnerships have fostered innovation and contributed to the advancement of their shared field.

Conclusion

James Hendrie's contributions to the field of interferometry through his patent and collaborations highlight his role as a significant inventor. His work continues to influence various applications and showcases the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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