Coquitlam, Canada

James Gimlett

USPTO Granted Patents = 2 

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 52(Granted Patents)


Company Filing History:


Years Active: 2015-2017

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2 patents (USPTO):Explore Patents

Title: James Gimlett: Innovator in X-ray Scanning Technology

Introduction

James Gimlett is a notable inventor based in Coquitlam, Canada. He has made significant contributions to the field of X-ray scanning technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and effectiveness of X-ray imaging systems.

Latest Patents

Gimlett's latest patents include innovative designs for multi-linear X-ray scanning systems. One of his patents describes a scanning transmission X-ray imaging system that features an X-ray source producing X-rays at a focal spot. This system includes X-ray detector arrays that detect X-rays along a detector dimension, with a collimator that defines slits to collimate the X-rays into linear beams. The design ensures that the linear X-ray beams remain aligned with the respective arrays as they move. Another patent outlines an X-ray scanner that produces a fan of X-rays, with a collimator that collimates the fan into a linear beam. This system allows for the creation of an X-ray scanned image of an object within the emission cone when the linear beam is panned across it.

Career Highlights

James Gimlett is currently employed at Visuum, LLC, where he continues to develop advanced X-ray scanning technologies. His work has been instrumental in pushing the boundaries of what is possible in X-ray imaging.

Collaborations

Gimlett collaborates with talented individuals such as John D Cox and Shaun Georges, contributing to a dynamic work environment that fosters innovation.

Conclusion

James Gimlett's contributions to X-ray scanning technology exemplify his commitment to innovation in the field. His patents reflect a deep understanding of the complexities involved in X-ray imaging, and his work continues to influence advancements in this critical area of technology.

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