Baltimore, MD, United States of America

James Fotheringham Jackson

This inventor holds 1 USPTO granted patent. Top assignee: Subcom, LLC. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Fotheringham Jackson. Retrieved from https://idiyas.com/inventor/james-fotheringham-jackson

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: James Fotheringham Jackson: Cable Inspection Innovation.

Introduction

James Fotheringham Jackson is an inventor associated with SubCom, LLC, in Baltimore, Maryland. His patent work addresses inspection of cables and cable joints using X-ray imaging and image analysis.

Latest Patents

Jackson is credited with 1 patent: “Imaging Device and System for Inspecting Cables and Cable Joints.” The invention describes an inspection system with an X-ray cabinet, an X-ray camera, and positioning equipment that captures images of cable sections or joints.

A processor evaluates the images for bounded areas that may indicate inclusions or voids. It measures those areas by counting pixels and compares their size with an allowance threshold. If an area exceeds the threshold, the system flags it and identifies the corresponding pixel locations, which can be mapped to a physical location in the cable or joint.

Career Highlights

Jackson’s documented patent contribution focuses on applying imaging and automated analysis to cable inspection. The system is designed to help identify and locate potential defects in cables and cable joints.

Collaborations

Jackson is associated with SubCom, LLC. The provided information also names Andrew David Levins and Joseph Man as coworkers; it does not specify their roles in the patent.

Conclusion

James Fotheringham Jackson’s patent describes an X-ray-based approach for detecting and locating potential cable and joint defects, contributing an inspection-focused innovation associated with SubCom, LLC.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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