James F McKnight

Title: James F McKnight: Innovator in Coordinate Measuring Technology

Introduction

James F McKnight is a notable inventor based in San Marcos, CA (US). He has made significant contributions to the field of coordinate measuring technology, holding 2 patents that showcase his innovative spirit and technical expertise.

Latest Patents

One of his latest patents is the Articulating CMM Probe. This articulating probe is designed for use with a coordinate measuring machine and comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion is configured for attachment to a coordinate measuring machine, while the measuring portion is designed to contact an object to be measured. The articulating joint allows for rotation between the attachment and measuring portions, and it includes an angular sensor to measure the angle of the joint.

Career Highlights

James F McKnight is currently employed at Hexagon Metrology GmbH, where he continues to develop innovative solutions in the field of metrology. His work has been instrumental in advancing the capabilities of coordinate measuring machines, enhancing precision and efficiency in various applications.

Collaborations

Throughout his career, McKnight has collaborated with talented professionals such as Paul Ferrari and Hyun Kwon Jung. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

James F McKnight's contributions to coordinate measuring technology exemplify his dedication to innovation and excellence. His patents and work at Hexagon Metrology GmbH highlight his role as a key figure in the advancement of metrology solutions.