Kingsport, TN, United States of America

James E Briddell

This inventor holds 1 USPTO granted patent. Top assignee: Eastman Chemical Company. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James E Briddell. Retrieved from https://idiyas.com/inventor/james-e-briddell

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: James E. Briddell and Hot-Melt Flow Contamination Testing.

Introduction

James E. Briddell is an inventor associated with Kingsport, Tennessee, and Eastman Chemical Company. His patent work addresses the detection of contaminants in hot-melt flows, where maintaining the material’s temperature during measurement is important.

Latest Patents

Briddell is credited with 1 patent, titled “Flow Contamination Tester.” The invention describes an apparatus that measures contamination in a hot-melt flow as the material passes through a flow-cell tube. A laser directs energy through the tube and melt, while a detector produces an electrical signal corresponding to the size of a contaminant. A heater maintains the melt’s temperature during testing. The components are housed in an enclosure with a cooling chamber that thermally isolates the detector from the heated flow.

Career Highlights

Briddell’s listed invention focuses on combining temperature control with optical detection. This design enables contamination measurement while the hot melt remains heated as it moves through the apparatus.

Collaborations

Briddell’s listed coworkers include Richard V. Brooks and Robert L. Fuller. The patent information associates his work with Eastman Chemical Company.

Conclusion

James E. Briddell’s patent describes a specialized approach to detecting contaminants in hot-melt materials while preserving the temperature conditions required for testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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