James David Hunt

Title: Innovations of James David Hunt

Introduction

James David Hunt is a notable inventor based in Charlotte, NC, recognized for his contributions to the field of surface inspection technology. With a total of two patents to his name, Hunt has made significant advancements in methods for mapping surface topography and inspecting reflective surfaces.

Latest Patents

Hunt's latest patents include a "Method and apparatus for mapping surface topography of a substrate" and a "Surface inspection scanning system." The first patent focuses on creating full surface maps of slope and height for highly smooth surfaces, such as silicon wafers. This apparatus utilizes a light source to generate a beam that scans the wafer's surface, with a quad cell light detector capturing the reflected light. The processor calculates changes in surface slopes and flags defects based on height gradients. The second patent describes a system for laser scanning reflective surfaces, monitoring reflected energy to detect and classify flaws. This technology is crucial for assessing the condition of silicon wafers used in fabricating integrated circuits and other electronic components.

Career Highlights

Throughout his career, Hunt has worked with several companies, including Aeronca Electronics, Inc. and Ade Corporation. His experience in these organizations has contributed to his expertise in surface inspection technologies and has allowed him to develop innovative solutions in the field.

Collaborations

Hunt has collaborated with notable coworkers such as W Jerry Alford and Charles J Cushing, further enhancing his work and contributions to the industry.

Conclusion

James David Hunt's innovative patents and career achievements highlight his significant role in advancing surface inspection technology. His work continues to impact the field, particularly in the manufacturing of electronic components.