Company Filing History:
Years Active: 2003-2007
Title: Innovations by James D Shinn, II
Introduction
James D Shinn, II is an accomplished inventor based in South Royalton, VT (US). He holds 2 patents that showcase his expertise in subsurface material property measurement and direct push tool systems. His innovative contributions have significantly advanced the field of subsurface characterization.
Latest Patents
One of his latest patents is focused on subsurface material property measurement. This invention allows for the in situ measurement of soil or chemical properties using a direct push method. It involves rotating a ring bit at the end of a casing to drill through subsurface materials, lowering a measurement probe through the advanced casing, and gathering material property data from sensors attached to the probe. The probe can be withdrawn for drilling and then replaced for further data gathering.
Another notable patent is the wireline system for multiple direct push tool usage. This tool latching and retrieval system enables the deployment and retrieval of various direct push subsurface characterization tools through an embedded rod string during a single penetration. This innovation allows for the in situ interchange of different tools and the rapid retrieval of soil core samples from multiple depths without requiring withdrawal of the rod string from the ground.
Career Highlights
James D Shinn, II is currently employed at Applied Research Associates, Inc., where he continues to develop innovative solutions in subsurface characterization. His work has contributed to advancements in environmental engineering and geotechnical investigations.
Collaborations
He has collaborated with notable colleagues such as Stephen P Farrington and Charles R Reed, Jr., further enhancing the impact of his inventions through teamwork and shared expertise.
Conclusion
James D Shinn, II's contributions to subsurface material property measurement and direct push tool systems reflect his dedication to innovation in the field. His patents not only demonstrate his technical skills but also his commitment to advancing subsurface characterization techniques.