The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Nov. 22, 2004
James D. Shinn, Ii, South Royalton, VT (US);
Charles R. Reed, Jr., Tomball, TX (US);
Stephen P. Farrington, Stockbridge, VT (US);
Kenneth A. Mcintosh, Bethel, VT (US);
James D. Shinn, II, South Royalton, VT (US);
Charles R. Reed, Jr., Tomball, TX (US);
Stephen P. Farrington, Stockbridge, VT (US);
Kenneth A. McIntosh, Bethel, VT (US);
Applied Research Associates, Inc., Albuquerque, NM (US);
Abstract
Subsurface material property measurements, such as soil or chemical properties, are obtained in situ by a direct push method that includes rotating a ring bit at the end of a casing to drill through subsurface materials, lowering a measurement probe through the advanced casing, extending the lowered measurement probe through the ring bit, and advancing the extended probe through the soil at a controlled rate while gathering material property data from sensors attached to the probe. The probe may be withdrawn for drilling, and then replaced for further data gathering.