Company Filing History:
Years Active: 1990
Title: The Innovations of James D. Merriam
Introduction
James D. Merriam is a notable inventor based in Del Mar, California. He has made significant contributions to the field of infrared detection technology. His work primarily focuses on developing advanced testing apparatuses that enhance the performance and reliability of infrared detectors.
Latest Patents
Merriam holds a patent for an "Electron beam apparatus for testing infrared detectors." This innovative apparatus is designed to test infrared detectors in response to a selectively controlled electron beam within a cryogenically shielded environment. The apparatus includes a cryostat with an aperture positioned adjacent to a scanning electron microscope. An electron beam emitted from the microscope propagates through the aperture to illuminate an infrared detector mounted within the cryostat. This setup allows for testing in an environment that is substantially free of spurious infrared radiation. He has 1 patent to his name.
Career Highlights
Merriam's career is marked by his association with the United States Navy, where he works as part of a team dedicated to advancing military technology. His expertise in electron beam technology and infrared detection has positioned him as a valuable asset in his field.
Collaborations
Throughout his career, Merriam has collaborated with several talented individuals, including Larry D. Flesner and Welsey L. Eisenman. These collaborations have fostered innovation and contributed to the development of cutting-edge technologies.
Conclusion
James D. Merriam's contributions to the field of infrared detection technology exemplify the impact of innovative thinking in engineering. His work continues to influence advancements in testing methodologies, ensuring the reliability of infrared detectors in various applications.