The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 1990
Filed:
Dec. 08, 1988
Larry D Flesner, San Diego, CA (US);
Welsey L Eisenman, Del Mar, CA (US);
James D Merriam, Del Mar, CA (US);
Richard L Bates, San Diego, CA (US);
Rolf N Dahle, San Diego, CA (US);
Douglas C Arrington, Albuquerque, NM (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
An apparatus for testing infrared detectors in response to a selectively controlled electron beam within a cryogenically shielded environment includes a cryostat having an aperture which is positioned adjacent to a scanning electron microscope. An electron beam emitted from the microscope propagates through the aperture to illuminate an infrared detector mounted within the cryostat so that the detector can be tested in an environment substantially free of spurious infrared radiation.