This inventor holds 1 USPTO granted patent. Top assignee: Texas Instruments Corporation. Active years: 2003.
Company Filing History:
Years Active: 2003
Title: James D Krouse: Innovator in Semiconductor Analysis
Introduction
James D Krouse is a notable inventor based in Lewisville, TX (US). He has made significant contributions to the field of semiconductor analysis, particularly through his innovative patent. His work has implications for the advancement of technology in semiconductor devices.
Latest Patents
Krouse holds a patent titled "Assembly and method for improved scanning electron microscope analysis of semiconductor devices." This invention includes a structure with a first layer and a second layer, where the second layer shrinks substantially when examined with a scanning electron microscope having a beam energy of at least 1.5 KeV. The surface of the structure is coated with a material composed of Iridium, which is of sufficient thickness to reduce the shrinkage of the second layer to approximately a predetermined amount during examination.
Career Highlights
James D Krouse is associated with Texas Instruments Corporation, a leading company in the semiconductor industry. His work at Texas Instruments has allowed him to contribute to advancements in semiconductor technology and analysis.
Collaborations
Krouse has collaborated with notable coworkers, including Fred Y Clark and Robyn R Carlson. These collaborations have likely enhanced the development and implementation of his innovative ideas.
Conclusion
James D Krouse's contributions to semiconductor analysis through his patent demonstrate his commitment to innovation in technology. His work continues to influence the field and showcases the importance of advancements in semiconductor devices.