Ipswich, United Kingdom

James Christy

This inventor holds 1 USPTO granted patent. Top assignee: Amazon Technologies, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James Christy. Retrieved from https://idiyas.com/inventor/james-christy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: James Christy and Scalable Media Player Defect Detection.

Introduction

James Christy is an inventor associated with Ipswich, Great Britain, and Amazon Technologies, Inc. His work includes a patent for detecting user interface defects in media player applications.

Latest Patents

Christy’s listed patent, “Scalable User Interface Defect Detection in Media Player Applications via Analysis of Page Structure,” describes techniques for identifying interface defects without creating a reference image. The method receives a defect-detection request through a cloud provider network, captures an image of a user interaction, identifies interface components from the image’s pixels, and detects defects based on those components. It then generates an output based at least in part on the detected defect. Christy is associated with 1 patent.

Career Highlights

Christy’s listed invention applies cloud-based image analysis to quality assurance for media player interfaces. By analyzing interface components rather than comparing an image against a reference image, the approach offers an alternative method for detecting defects.

Collaborations

Christy’s listed coworkers include Noel Evans and Mayur Shyamsunder Rao. The patent is associated with Amazon Technologies, Inc.

Conclusion

James Christy’s patent describes a cloud-based approach to detecting defects in media player user interfaces through analysis of page structure and captured interactions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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