West Chester, OH, United States of America

James Andrew Lanzarotta

This inventor holds 1 USPTO granted patent. Top assignee: General Electric Company. Active years: 2003.


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Innovations of James Andrew Lanzarotta

Introduction

James Andrew Lanzarotta is an accomplished inventor based in West Chester, Ohio. He has made significant contributions to the field of quality enhancement through his innovative methods and systems. His work primarily focuses on generating comprehensive project reports that aid in process improvement.

Latest Patents

Lanzarotta holds a patent for "Methods and systems for generating a quality enhancement project report." This patent outlines a system that generates a report for a Six Sigma quality enhancement project directed at a selected process. The report includes essential metrics such as starting and ending process capabilities, confidence levels, performance charts, and economic data related to cost savings from implementing process improvements. The system allows users to automatically generate project reports by entering basic project information into a computer-implemented form.

Career Highlights

Lanzarotta is associated with General Electric Company, where he applies his expertise in quality enhancement. His innovative approach has contributed to the development of effective methodologies that streamline project reporting and improve overall process performance.

Collaborations

Lanzarotta has worked alongside notable colleagues, including Steven Jeffrey Heslop and Michael Steven Olle. Their collaborative efforts have further advanced the field of quality enhancement and project reporting.

Conclusion

James Andrew Lanzarotta's contributions to the field of quality enhancement through his innovative patent demonstrate his commitment to improving processes and generating valuable insights. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
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