Lancaster, MA, United States of America

James A McCandless

This inventor holds 1 USPTO granted patent. Top assignee: Acton Research Corp.. Active years: 2008.


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Innovations of James A McCandless

Introduction

James A McCandless is an accomplished inventor based in Lancaster, MA (US). He is known for his innovative contributions to the field of electromagnetic measurement. His work has led to the development of a unique instrument that enhances the accuracy of electromagnetic property measurements.

Latest Patents

James A McCandless holds a patent for a "Self-referencing instrument and method thereof for measuring electromagnetic properties." This invention features a self-referencing instrument designed to measure electromagnetic radiation. The instrument includes a mounting member that allows a sample to be positioned in two distinct locations. In the first position, electromagnetic radiation impinges on the sample, while in the second position, it does not. A detection unit captures the electromagnetic radiation from the sample and generates a sample signal in the first position. Conversely, it generates a reference signal when the sample is in the second position. A processor processes both signals, resulting in continuous and accurate reference measurements. This innovation allows for efficient error compensation and precise measurements.

Career Highlights

James A McCandless is associated with Acton Research Corporation, where he applies his expertise in electromagnetic measurement. His role at the company has allowed him to further develop his inventions and contribute to advancements in the field.

Conclusion

James A McCandless is a notable inventor whose work in electromagnetic measurement has led to significant innovations. His patented self-referencing instrument exemplifies his commitment to enhancing measurement accuracy.

Profile summary based on public USPTO records.
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